The ECOSWIR project is focused on strengthening Spain’s semiconductor value chain through cutting-edge research and development of new technologies for components designed for 3D systems based on SWIR (Short-Wave Infrared) imaging. This initiative aims to position Spain as a leader in advanced solutions for inspection and quality control within the semiconductor industry.
The latest review by the Centre for the Development of Industrial Technology (CDTI) took place at ASENSE’s facilities in El Prat de Llobregat. During the visit, the team showcased significant progress in the second phase of development, including advancements in the design and implementation of an automated vision system for detecting defects in laser chips and performing microscopic wafer inspections, as well as improvements in the SWIR imaging illumination system.
The collaboration between Monocrom, QURV, and ASENSE reinforces technological research and innovation, while strengthening Spain’s strategic photonics industry network.
ECOSWIR represents not only a technological milestone but also a strategic opportunity to consolidate the national semiconductor sector. By implementing SWIR-based inspection systems, the project aims to enhance defect detection accuracy, streamline manufacturing processes, and boost Spain’s competitiveness in a key sector for digital transformation and industrial innovation.